Datavision enables the semiconductor supply chain to analyse test data and manage yield.
Features include:
Comprehensive set of statistical tools.
Wafer maps.
WAT/parametric, wafer and final test data.
Correlation across different data types.
'What if' analysis by applying custom limits to real and entire data sets.
Web reports created 'on-the-fly'.
Customisable data presentation.
Dedicated data loaders by data type.
Built-in automation capability for event driven custom analysis.
For more information please Contact Us directly or complete the Enquiry form.
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