Datavision enables the semiconductor supply chain to analyse test data and manage yield.
Features include:
Database Comprehensive set of statistical tools Wafer maps WAT/parametric, wafer and final test data Correlation across different data types Web reports created 'on-the-fly' 'What if' analysis by applying custom limits to real and entire data sets Customisable data presentation Dedicated data loaders by data type Built-in automation capability for event driven custom analysis |
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