Waferdata Datavision

Products

Datavision

Datavision enables the semiconductor supply chain to analyse test data and manage yield.

Features include:

	Database.
	Comprehensive set of statistical tools.
	Wafer maps.
	WAT/parametric, wafer and final test data.
	Correlation across different data types.
	'What if' analysis by applying custom limits to real and entire data sets.
	Web reports created 'on-the-fly'.
	Customisable data presentation.
	Dedicated data loaders by data type.
	Built-in automation capability for event driven custom analysis.

For more information please Contact Us directly or complete the Enquiry form.