Waferdata
Products
Datavision

Datavision enables the semiconductor supply chain to analyse test data and manage yield.

Features include:

Database
Comprehensive set of statistical tools
Wafer maps
WAT/parametric, wafer and final test data
Correlation across different data types
Web reports created 'on-the-fly'
'What if' analysis by applying custom limits to real and entire data sets
Customisable data presentation
Dedicated data loaders by data type
Built-in automation capability for event driven custom analysis

For more information please Contact Us directly or complete the Enquiry form.

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